| Program Committee
|
Simon Baker, Carnegie Mellon University,
USA |
| Bir Bhanu,
University of California Riverside, USA |
| Zhaoqi Bian,
Tsinghua University, China |
| Josef Bigun,
Halmstad Univ. and Chalmers Univ.of Tech., Sweden |
| Wageeh W
Boles, Queensland University of Technology, Australia |
| Ruud (Rudolf)
M. Bolle, IBM T. J. Watson Research Center, USA |
| Manfred U.
A. Bromba, Bromba GmbH, Biometrics, Germany, |
| Keith Chan,
Hong Kong Polytechnic University, HK |
| Ke Chen,
UMIST, UK |
| RI Damper,
University of Southampton, UK |
| Kenneth Dong,
ID One Inc., USA |
| Michael Fairhurst,
University of Kent, UK |
| Srinivas
Gutta, Philips, USA |
| Wen Gao,
Chinese Academy of Sciences, China |
| Lin Hong,
Identix Incorporation, USA |
| Wen Hsing
Hsu, National Tsing Hua University, TW |
| Behrooz Kamgar-Parsi,
Naval Research Lab., USA |
| Mohamed Kamel,
University of Waterloo, Canada |
| Bernhard
Kaemmerer, Siemens, Germany |
| Daijin Kim,
Pohang University of Science and Technology, Korea |
|
Jaihie Kim, Yonsei University, Korea |
| Josef Kittler,
University of Surrey, UK |
| Naohisa Komatsu,
Waseda University, Japan |
| Alex Kot,
Nanyang Technological University, Singapore |
| Kin
Man Lam, Hong Kong Polytechnic University |
| Julia Langenbach,
Delphi Automotive Systems, Germany |
|
Seong-Whan Lee, Korea University, Korea |
| Lei Li, Hosei
University, Japan |
| Stan Li,
Microsoft Research Asia, China |
| Xiaobo Li,
University of Alberta, Canada |
| Ze-Nian Li,
Simon Frason University, Canada |
| Lee Luan
Ling, State University of Campinas, Brazil |
| Zhiqiang
Liu, City University of Hong Kong, HK |
| Javier Ortega-Garcia,
Universidad Politecnica de Madrid, Spain |
| Edwige Pissaloux,
Universite de Rouen, France |
| Salil Prabhakar,
DigitalPersona Inc., USA |
| K. Prasad,
Ford Motor Co., USA |
| James Reisman,
Siemens Corporate Research, Inc., USA |
| Gerhard Rigoll,
Munich University of Technology, Germany |
| Arun Ross,
West Virginia University, USA |
| Pat Sankar,
Printrak, USA |
| Ulf Cahn
Von Seelen, Iridian Technologies, USA |
| Dale Setlak,
AuhenTec Inc., USA |
| Pengfei Shi,
Shanghai Jiao Tong University, China |
| Kazuhiko
Sumi, Mitsubishi Electric Corporation, Japan |
| Eng Chong
Tan, Nanyang Technological University, Singapore |
| Michael Thieme,
International Biometric Group, USA |
| Pauli Tikkanen,
Nokia, Finland |
| Massimo Tistarelli,
Universita` di Sassari, Italy |
| Matthew
Turk, University of California, Santa Barbara, USA |
| Kaoru Uchida,
NEC Corporation, Japan |
|
Ajay
Kumar, Hong Kong Polytechnic University, HK |
| Claus Vielhauer,
Magdeburg University, Germany |
| Harry Wechsler,
George Mason University, USA |
| Hong Yan,
City University of Hong Kong, HK |
| Dit-Yan Yeung,
Hong Kong University of Science and Tech., HK |
| Pong Chin
Yuen, Hong Kong Baptist University |
| Michael T.
Yura, West Virginia University, USA |
|